A pixel-by-pixel correcting autobalanced detector for SRS microscopy
Lemberger, Nick S.; Wallmeier, Kristin; Fallnich, Carsten
Abstract in digital collection (conference) | Peer reviewedDetails about the publication
Name of the repository: Proceedings of Focus on Microscopy 2024
Status: Published
Release year: 2024
Conference: Focus on Microscopy, Genua, Italy
Link to the full text: https://www.focusonmicroscopy.org/2024-program-online/?source=pp&event_id=5817&tab=pdf&a_id=7407
Keywords: balancierte Detektion, stimulierte Raman-Streuung
Authors from the University of Münster
| Fallnich, Carsten | Professur für Angewandte Physik (Prof. Fallnich) |
| Lemberger, Nick Sidney | Professur für Angewandte Physik (Prof. Fallnich) |
| Wallmeier, Kristin | Professur für Angewandte Physik (Prof. Fallnich) |