Enhanced Sensitivity of Coherent Raman Imaging by a Frequency Modulated Portable Light Source
Brinkmann, Maximilian; Würthwein, Thomas; Hellwig, Tim; Wallmeier, Kristin; Dobner, Sven; Fallnich, Carsten
Research article in edited proceedings (conference) | Peer reviewedDetails about the publication
Publisher: Focus on Microscopy
Book title: Proceedings on the Focus on Microscopy
Page range: 1-1
Publishing company: Focus on Microscopy
Place of publication: Porto
Status: Published
Release year: 2021 (31/03/2021)
Language in which the publication is written: English
Conference: Focus on Microscopy (FOM), Porto, Portugal
Keywords: Frequenzmodulation, kohärente Raman-Streuung
Authors from the University of Münster
| Brinkmann, Maximilian | Professur für Angewandte Physik (Prof. Fallnich) |
| Dobner, Sven | Institute of Applied Physics |
| Fallnich, Carsten | Professur für Angewandte Physik (Prof. Fallnich) |
| Hellwig, Tim | Professur für Angewandte Physik (Prof. Fallnich) |
| Wallmeier, Kristin | Professur für Angewandte Physik (Prof. Fallnich) |
| Würthwein, Thomas | Institute of Applied Physics |