Triple junction segregation in nanocrystalline multilayers

Stender P., Balogh Z., Schmitz G.

Forschungsartikel (Zeitschrift) | Peer reviewed

Zusammenfassung

Triple junctions (TJ’s), topologically required linear defects of grain boundary structure, are suggested tocontrol the behavior of nanocrystalline material. However, measurements of their properties are rare. With atomprobe tomography, reliable analysis of singular features of the grain boundary structure becomes possible. Wereport microscopic measurements of segregation along individual TJ’s in Fe/Cr. By segregation to TJ’s nanometrictubular objects of distinct properties are formed. The determined segregation enthalpy of 0.076 eV indicates thatTJ’s provide considerable free volume similar to free surfaces.

Details zur Publikation

FachzeitschriftPhysical Review B
Jahrgang / Bandnr. / Volume83
Seitenbereich121407-1-121407-4
StatusVeröffentlicht
Veröffentlichungsjahr2011
Sprache, in der die Publikation verfasst istEnglisch
DOI10.1103/PhysRevB.83.121407

Autor*innen der Universität Münster

Balogh, Zoltán
Professur für Materialphysik I (Prof. Schmitz)
Schmitz, Guido
Institut für Materialphysik
Stender, Patrick
Institut für Materialphysik